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Surface and Interface Characterization by Electron Optical Methods
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Surface and Interface Characterization by Electron Optical Methods

The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.
Toimittaja
Ugo Valdre
Painos
Softcover reprint of the original 1st ed. 1988
ISBN
9781461595397
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
25.11.2012
Sivumäärä
319