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Structural, Syntactic, and Statistical Pattern Recognition
Tallenna

Structural, Syntactic, and Statistical Pattern Recognition

This volume in the Springer Lecture Notes in Computer Science (LNCS) series contains the papers presented at the S+SSPR 2010 Workshops, which was the seventh occasion that SPR and SSPR workshops have been held jointly.
Alaotsikko
Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings
ISBN
9783642149795
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
30.7.2010
Sivumäärä
758