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Structural, Syntactic, and Statistical Pattern Recognition
Tallenna

Structural, Syntactic, and Statistical Pattern Recognition

This book constitutes the refereed proceedings of the 9th International Workshop on Structural and Syntctic Pattern Recognition, SSPR 2002 and the 4th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2002 held jointly in Windsor, Ontario, Canada in August 2002. The 45 revised full papers and 35 poster papers presented together with three invited papers were carefully reviewed and selected from 116 submissions. The papers are organized in topical sections on graphs, grammars, and languages; graphs, strings, and grammars; documents and OCR; image shape analysis and application; density estimation and distribution models; multi classifiers and fusion; feature extraction and selection; general methodology; and image shape analysis and application.
Alaotsikko
Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings
Painos
2002 ed.
ISBN
9783540440116
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
24.7.2002
Sivumäärä
866