Tallenna
Structural, Syntactic, and Statistical Pattern Recognition
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.
The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions.
The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions.
- Alaotsikko
- Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
- Toimittaja
- Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly
- Painos
- 2018 ed.
- ISBN
- 9783319977843
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 2.8.2018
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 524
