Tallenna
Structural, Syntactic, and Statistical Pattern Recognition
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022.
The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions.
- Alaotsikko
- Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings
- Toimittaja
- Adam Krzyzak, Ching Y. Suen, Andrea Torsello, Nicola Nobile
- Painos
- 1st ed. 2022
- ISBN
- 9783031230271
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 2.1.2023
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 324
