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Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
Tallenna

Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance.
Painos
Softcover reprint of the original 1st ed. 1993
ISBN
9781461363798
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
27.9.2012
Sivumäärä
190