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Soft Error Mechanisms, Modeling and Mitigation
Tallenna

Soft Error Mechanisms, Modeling and Mitigation

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects.
Painos
Softcover reprint of the original 1st ed. 2016
ISBN
9783319808482
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
15.6.2018
Sivumäärä
105