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Soft Error Mechanisms, Modeling and Mitigation
Tallenna

Soft Error Mechanisms, Modeling and Mitigation

Kirjailija:
sidottu, 2016
englanti
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects.
Painos
1st ed. 2016
ISBN
9783319306063
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
4.3.2016
Sivumäärä
105