Semiconductor Memories
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
- Alaotsikko
- Technology, Testing, and Reliability
- Kirjailija
- Ashok K. Sharma
- ISBN
- 9780780310001
- Kieli
- englanti
- Paino
- 1043 grammaa
- Julkaisupäivä
- 24.9.2002
- Kustantaja
- IEEE Publications,U.S.
- Sivumäärä
- 480