Tallenna
Secondary Ion Mass Spectrometry SIMS IV
(4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS.
- Alaotsikko
- Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983
- Toimittaja
- A. Benninghoven, J. Okano, R. Shimizu, H.W. Werner
- Painos
- Softcover reprint of the original 1st ed. 1984
- ISBN
- 9783642822582
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 10.1.2012
- Sivumäärä
- 506
