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Secondary Ion Mass Spectrometry SIMS III
Tallenna

Secondary Ion Mass Spectrometry SIMS III

Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
Alaotsikko
Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981
Painos
Softcover reprint of the original 1st ed. 1982
ISBN
9783642881541
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
26.7.2012
Sivumäärä
447