Tallenna
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
- Alaotsikko
- Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
- Toimittaja
- Paula M. Vilarinho, Yossi Rosenwaks, Angus Kingon
- Painos
- 2005 ed.
- ISBN
- 9781402030178
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 2.3.2005
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 488
