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Scanning Probe Microscopy
Tallenna

Scanning Probe Microscopy

Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism.
Alaotsikko
Electrical and Electromechanical Phenomena at the Nanoscale
Painos
Softcover reprint of the original 1st ed. 2007
ISBN
9781493950362
Kieli
englanti
Paino
249 grammaa
Julkaisupäivä
4.11.2016
Sivumäärä
980