Tallenna
Scanning Microscopy for Nanotechnology
nidottu, 2010
englanti
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.
- Alaotsikko
- Techniques and Applications
- Toimittaja
- Weilie Zhou, Zhong Lin Wang
- Painos
- Softcover reprint of hardcover 1st ed. 2007
- ISBN
- 9781441922090
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 29.10.2010
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 522
