
Scanning Microscopy for Nanotechnology
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.
- Alaotsikko
- Techniques and Applications
- Toimittaja
- Weilie Zhou, Zhong Lin Wang
- Painos
- 2007 ed.
- ISBN
- 9780387333250
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 27.11.2006
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 522