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Scanning Microscopy for Nanotechnology
Tallenna

Scanning Microscopy for Nanotechnology

sidottu, 2006
englanti

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation.

Alaotsikko
Techniques and Applications
Painos
2007 ed.
ISBN
9780387333250
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
27.11.2006
Sivumäärä
522