Tallenna
Scanning Electron Microscopy and X-Ray Microanalysis
nidottu, 2013
englanti
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
- Alaotsikko
- Third Edition
- Kirjailija
- Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
- Painos
- Third Edition 2003
- ISBN
- 9781461349693
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 31.5.2013
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 689
