Tallenna
Scanning Electron Microscopy and X-Ray Microanalysis
nidottu, 2011
englanti
In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA.
- Alaotsikko
- A Text for Biologists, Materials Scientists, and Geologists
- Kirjailija
- Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Alton D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin
- Painos
- Second Edition 1992
- ISBN
- 9781461276531
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 28.9.2011
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 840
