Tallenna
Resonant X-Ray Scattering in Correlated Systems
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.
- Toimittaja
- Youichi Murakami, Sumio Ishihara
- Painos
- Softcover reprint of the original 1st ed. 2017
- ISBN
- 9783662571224
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 7.7.2018
- Sivumäärä
- 241
