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Reliability and Degradation of III-V Optical Devices
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Reliability and Degradation of III-V Optical Devices

Kirjailija:
sidottu, 1996
englanti
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.
Kirjailija
Osamu Ueda
ISBN
9780890066522
Kieli
englanti
Paino
698 grammaa
Julkaisupäivä
30.9.1996
Kustantaja
Artech House
Sivumäärä
372