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Recent Interferometry Applications in Topography and Astronomy
Tallenna

Recent Interferometry Applications in Topography and Astronomy

sidottu, 2012
englanti
This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.
Toimittaja
Ivan Padron
ISBN
9789535104049
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
21.3.2012
Kustantaja
In Tech
Sivumäärä
232