Tallenna
Recent Advances in Metrology
The book highlights and discusses the recent technological developments in the areas of fundamental and quantum metrology, physico-mechanical and electrical metrology, time and frequency metrology, materials metrology, industrial and legal metrology, digital transformation in metrology, among others.
- Alaotsikko
- Select Proceedings of AdMet 2022
- Toimittaja
- Sanjay Yadav, Naveen Garg, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Harish Kumar, Venu Gopal Achanta
- Painos
- 1st ed. 2024
- ISBN
- 9789819945962
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 2.9.2023
- Kustantaja
- SPRINGER VERLAG, SINGAPORE
- Sivumäärä
- 221
