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Quantitative X-Ray Diffractometry
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Quantitative X-Ray Diffractometry

One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases.
Toimittaja
Inez Mureinik
Painos
Softcover reprint of the original 1st ed. 1995
ISBN
9781461395379
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
27.12.2011
Sivumäärä
372