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Progress in Transmission Electron Microscopy 2
Tallenna

Progress in Transmission Electron Microscopy 2

This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.
Alaotsikko
Applications in Materials Science
Painos
Softcover reprint of hardcover 1st ed. 2001
ISBN
9783642087189
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
19.10.2010
Sivumäärä
307