Production Testing of RF and System-on-a-Chip Devices for Wireless Communications

With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment. This hands-on reference provides you with the time-saving algorithms and practical techniques you need to handle your challenging projects with speed and confidence. The book also offers a thorough understanding of the capital expenditures involved in production testing, to help you make sound investment decisions. You discover a cost-of-test model that helps you compare and contrast production testing methods with ease.