Tallenna
Principles of Analytical Electron Microscopy
nidottu, 2013
englanti
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
- Toimittaja
- Joseph Goldstein, David C. Joy, Alton D. Romig Jr.
- Painos
- Softcover reprint of the original 1st ed. 1986
- ISBN
- 9781489920393
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 8.7.2013
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 448
