Tallenna
Practical Scanning Electron Microscopy
nidottu, 2011
englanti
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
- Alaotsikko
- Electron and Ion Microprobe Analysis
- Toimittaja
- Joseph Goldstein
- Painos
- Softcover reprint of the original 1st ed. 1975
- ISBN
- 9781461344247
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 12.10.2011
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 582
