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Positron Annihilation in Semiconductors
Tallenna

Positron Annihilation in Semiconductors

The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.
Alaotsikko
Defect Studies
Painos
Softcover reprint of hardcover 1st ed. 1999
ISBN
9783642084034
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.12.2010
Sivumäärä
383