Tallenna
Physical Principles of Electron Microscopy
Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
- Alaotsikko
- An Introduction to TEM, SEM, and AEM
- Kirjailija
- R.F. Egerton
- Painos
- 1st ed. 2005. Corr. 2nd printing 2011
- ISBN
- 9780387258003
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 3.8.2005
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 202
