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Pattern Analysis and Machine Intelligence
Tallenna

Pattern Analysis and Machine Intelligence

This book constitutes the referred proceedings of the First International Conference on Pattern Analysis and Machine Intelligence, ICPAMI 2024, held in Shanghai, China, from August 30 to September 01, 2024.

The 28 papers presented here were carefully reviewed and selected from 56 submissions.

Alaotsikko
First International Conference, ICPAMI 2024, Shanghai, China, August 30 – September 1, 2024, Proceedings
ISBN
9789819633487
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
27.3.2025
Sivumäärä
238