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Optical Metrology
Tallenna

Optical Metrology

Kirjailija:
sidottu, 2002
englanti
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.
* End-of-chapter problems. Solutions available at http://www.wiley.co.uk/opticalmetrology
ISBN
9780470843000
Kieli
englanti
Paino
851 grammaa
Julkaisupäivä
29.8.2002
Sivumäärä
392