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Optical Characterization of Epitaxial Semiconductor Layers
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Optical Characterization of Epitaxial Semiconductor Layers

The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade.
Painos
Softcover reprint of the original 1st ed. 1996
ISBN
9783642796807
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
14.12.2011
Sivumäärä
429