Tallenna
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Kirjailija:
nidottu, 2012
englanti
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits.
- Kirjailija
- Amith Singhee, Rob A. Rutenbar
- Painos
- 2009 ed.
- ISBN
- 9789400736870
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 7.3.2012
- Kustantaja
- Springer
- Sivumäärä
- 195
