Neutron and X-ray Reflectometry
This book introduces the techniques of neutronand x-ray reflectometry and presents the studies carried out to date, using thetechniques to understand emerging phenomena at the interfaces of thin films.
- Alaotsikko
- Emerging phenomena at heterostructure interfaces
- Kirjailija
- Saibal Basu, Singh Surendra
- ISBN
- 9780750346931
- Kieli
- englanti
- Paino
- 518 grammaa
- Sarja
- IOP ebooks
- Julkaisupäivä
- 27.12.2022
- Kustantaja
- Institute of Physics Publishing
- Sivumäärä
- 182
