Tallenna
Nanotechnology: Principles and Practices
The book also explains the functional principles of essential techniques, such as scanning tunneling microscopy (STM), atomic force microscopy (AFM), scanning near field optical microscopy (SNOM), Raman spectroscopy and photoelectron microscopy.
- Kirjailija
- Sulabha K. Kulkarni
- Painos
- Softcover reprint of the original 3rd ed. 2015
- ISBN
- 9783319791630
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 27.3.2019
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 403
