Nanoscale Spectroscopy and Its Applications to Semiconductor Research
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Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.
- Toimittaja
- Watanabe Y., S. Heun, Salviati G., Yamamoto N.
- ISBN
- 9783540433125
- Kieli
- englanti
- Paino
- 518 grammaa
- Julkaisupäivä
- 19.7.2002
- Sivumäärä
- 308