Siirry suoraan sisältöön
Nanometer Variation-Tolerant SRAM
Tallenna

Nanometer Variation-Tolerant SRAM

This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
Alaotsikko
Circuits and Statistical Design for Yield
Painos
2013 ed.
ISBN
9781493902200
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
15.10.2014
Sivumäärä
172