Tallenna
Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals
This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers’ understanding and visualization.
- Alaotsikko
- A Scanning Probe Microscopy Approach
- Kirjailija
- Nicholas D. Kay
- Painos
- Softcover reprint of the original 1st ed. 2018
- ISBN
- 9783319888989
- Kieli
- englanti
- Paino
- 310 grammaa
- Sarja
- Springer Theses
- Julkaisupäivä
- 4.9.2018
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 122
