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Multi-Chip Module Test Strategies
Tallenna

Multi-Chip Module Test Strategies

This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Toimittaja
Yervant Zorian
Painos
Softcover reprint of the original 1st ed. 1997
ISBN
9781461377986
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
4.10.2012
Sivumäärä
167