Siirry suoraan sisältöön
Microstructural Characterisation Techniques
Tallenna

Microstructural Characterisation Techniques

It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy.
Painos
2022 ed.
ISBN
9789811935114
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
17.9.2023
Sivumäärä
242