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Microscopy of Semiconducting Materials
Tallenna

Microscopy of Semiconducting Materials

sidottu, 2006
englanti

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA.

Alaotsikko
Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
Painos
2005 ed.
ISBN
9783540319146
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
10.4.2006
Sivumäärä
540