Tallenna
Microscopy of Semiconducting Materials 2007
In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes.
- Alaotsikko
- Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
- Toimittaja
- A.G. Cullis, P.A. Midgley
- Painos
- 2008 ed.
- ISBN
- 9781402086144
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 18.9.2008
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 498
