Tallenna
Microbeam Analysis
Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
- Alaotsikko
- Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000
- Toimittaja
- D Williams, R Shimizu
- ISBN
- 9780750306850
- Kieli
- englanti
- Paino
- 1020 grammaa
- Julkaisupäivä
- 1.1.2000
- Kustantaja
- Institute of Physics Publishing
- Sivumäärä
- 284
