Tallenna
Metal Impurities in Silicon- and Germanium-Based Technologies
Kirjailija:
sidottu, 2018
englanti
218,80 €
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
- Alaotsikko
- Origin, Characterization, Control, and Device Impact
- Kirjailija
- Cor Claeys, Eddy Simoen
- Painos
- 1st ed. 2018
- ISBN
- 9783319939247
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 22.8.2018
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 438
