
Machine Learning Support for Fault Diagnosis of System-on-Chip
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems.
- Toimittaja
- Patrick Girard, Shawn Blanton, Li-C. Wang
- Painos
- 2023 ed.
- ISBN
- 9783031196416
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 14.3.2024
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 316