Tallenna
Lock-in Thermography
Kirjailija:
sidottu, 2019
englanti
Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.
- Alaotsikko
- Basics and Use for Evaluating Electronic Devices and Materials
- Kirjailija
- Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
- Painos
- Third Edition 2018
- ISBN
- 9783319998244
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 22.1.2019
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 321
