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Lifetime Reliability-aware Design of Integrated Circuits
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Lifetime Reliability-aware Design of Integrated Circuits

They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits.
Painos
2023 ed.
ISBN
9783031153471
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
18.11.2023
Sivumäärä
107