Siirry suoraan sisältöön
Kelvin Probe Force Microscopy
Tallenna

Kelvin Probe Force Microscopy

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

Alaotsikko
Measuring and Compensating Electrostatic Forces
ISBN
9783642271137
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
30.11.2013
Sivumäärä
334