Siirry suoraan sisältöön
Introduction to X-Ray Spectrometric Analysis
Tallenna

Introduction to X-Ray Spectrometric Analysis

However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif­ fraction, very few offer full courses in x-ray spectrometric analysis.
Painos
1978 ed.
ISBN
9780306310911
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.3.1978
Sivumäärä
485