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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
Tallenna

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon

Basically all properties of semiconductor devices are influenced by the distribution of point defects in their active areas. This book contains the first comprehensive review of the properties of intrinsic point defects, acceptor and donor impurities, isovalent atoms, chalcogens, and halogens in silicon, as well as of their complexes.
Kirjailija
Peter Pichler
Painos
Softcover reprint of the original 1st ed. 2004
ISBN
9783709172049
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.11.2012
Sivumäärä
554