Interfacial Compatibility in Microelectronics
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This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
- Alaotsikko
- Moving Away from the Trial and Error Approach
- Kirjailija
- Laurila Tomi, Vuorinen Vesa, Mervi Paulasto-Kröckel, Turunen Markus, Toni T. Mattila, Kivilahti Jorma
- ISBN
- 9781447160687
- Kieli
- englanti
- Paino
- 281 grammaa
- Sarja
- Microsystems
- Julkaisupäivä
- 22.2.2014
- Kustantaja
- Springer London
- Sivumäärä
- 218
